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Specifications
Mfr. Part #:
HAH1DR500-S
Key Attributes
Model Number:
HAH1DR500-S
Product Description
Product Overview
The LEM HAH1DR 500-S is an open-loop Hall effect current transducer designed for high-power automotive applications. It provides galvanic separation between the primary and secondary circuits, enabling the electronic measurement of DC, AC, or pulsed currents. With a flexible current measuring range within the same housing and excellent accuracy, linearity, and low thermal drift, it is ideal for demanding automotive systems.
Product Attributes
- Brand: LEM
- Technology: Open Loop Hall Effect
- Material (Case): PBT GF 30
- Material (Magnetic Core): Iron silicon alloy
- Electrical Terminal Coating: Brass tin plated
- Connector Type: AMP 1473672-1
- Certifications: Directive 2004/104/CE, IEC 60664-1, ISO 16750-2, ISO 16750-3, ISO 16750-4, JESD22-A101, IEC 60068-2-64, IEC 60068-2-14, IEC 61000-4-3, IEC 61000-4-2
Technical Specifications
| Parameter | Symbol | Unit | Specification | Conditions |
| Operating Characteristics in Nominal Range (IPN) | ||||
| Primary current | IPN | A | 500 | |
| Supply voltage | UC | V | 4.75 - 5 - 5.25 | |
| Ambient operating temperature | TA | C | - 40 to 125 | Connector limited 105 C |
| Output voltage (Analog) | Vout | V | Vout = (UC/5) (Vo + G IP ) | @ UC = 5 V |
| Sensitivity | G | mV/A | 4 | @ UC = 5 V |
| Current consumption | IC | mA | 15 - 20 | @ UC = 5 V, - 40 C < TA< 125 C |
| Load resistance | RL | K | 10 | |
| Capacitive loading | CL | nF | 1 - 100 | |
| Output internal resistance | Rout | 10 | DC to 1 kHz | |
| Ratiometricity error | r | % | 0.5 | |
| Sensitivity error | G | % | 0.5 | @ TA = 25 C, @ I = IP |
| Electrical offset current | IOE | A | 1.5 | @ TA = 25 C, @ UC = 5 V |
| Magnetic offset current | IOM | A | 1 | @ TA = 25 C, @ UC = 5 V, after IP |
| Global offset current | IO | A | 2.7 | @ TA = 25 C |
| Average temperature coefficient of VOE | TCIOEAV | mV/C | 0.03 | @ - 40 C < TA< 125 C |
| Average temperature coefficient of G | TCGAV | %/C | 0.02 | @ - 40 C < TA< 125 C |
| Linearity error | L | % | 1 | @ UC = 5 V, @ TA = 25 C, @ I = IP |
| Step response time to 90 % | tr | s | 6 - 10 | @ di/dt = 100 A/s |
| Frequency bandwidth | BW | kHz | 30 | @ - 3 dB |
| Output clamping voltage minimum | VSZ | V | 0.1 | @ UC = 5 V, @ TA = 25 C |
| Output clamping voltage maximum | V | 4.9 | @ UC = 5 V, @ TA = 25 C | |
| Output voltage noise peak-peak | Vno p-p | mV | 14 | DC to 1 kHz |
| Absolute Maximum Ratings (not operating) | ||||
| Primary current peak | Pmax | A | See Note 1 | |
| Supply continuous over voltage | UC | V | 7 | Not operating |
| Reverse voltage | V | - 0.5 | Transducer not protected | |
| Ambient storage temperature | TS | C | - 55 to 125 | |
| Electrostatic discharge voltage | UESD | kV | 2 | JESD 22-A114-B (HBM) |
| Continuous output current | Iout | mA | 10 | |
| RMS voltage for AC insulation test | Ud | kV | 2 | 50 Hz, 1 min |
| Continuous output over voltage (Analog) | Vout | V | UC + 0.5 | |
| Insulation resistance | RIS | M | 500 | 500 V - ISO 16750-2 |
| Output Short circuit duration | tc | minutes | 2 | |
2411271911_LEM-HAH1DR500-S_C454755.pdf
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