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quality Latched hall effect sensor HUAXIN S21C with two wire current output and open short circuit diagnostics factory
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quality Latched hall effect sensor HUAXIN S21C with two wire current output and open short circuit diagnostics factory
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Specifications
Sample Frequency:
20kHz
Operation Points:
8mT
Release Points:
8mT
Operating Temperature:
-40℃~+150℃
Voltage - Supply:
4V~24V
Mfr. Part #:
S21C
Package:
TO-92S
Key Attributes
Model Number: S21C
Product Description

Product Overview

The HXS21C is a current-output, latched Hall effect sensor based on a 60V BCD process platform, utilizing high-frequency chopping technology. It offers high magnetic field consistency and symmetry across its full operating voltage and temperature range. The integrated voltage regulator supports input voltages from 4V to 24V, making it suitable for industrial and automotive applications, while also providing strong electromagnetic interference (EMC) resistance and high reliability. The sensor incorporates dynamic offset cancellation and temperature compensation to minimize variations due to process, packaging, and thermal stress, ensuring stable sensitivity. It features an integrated voltage regulator, Hall array, amplifier, low-pass filter, hysteresis comparator, and output current control. The two-wire current output interface simplifies wiring and facilitates open/short circuit diagnostics. Available in 3-pin TO-92S (UA) and 3-pin SOT23-3L (SO) packages, both with 100% lead-free matte tin-plated leads.

Product Attributes

  • Brand: HuaXin Tech
  • Package Types: TO-92S (UA), SOT23-3L (SO)
  • Lead Finish: 100% Lead-free matte tin-plated

Technical Specifications

ParameterSymbolTest ConditionMinTypicalMaxUnitNotes
Thermal Resistance (Junction to Ambient)RjaUA package, single-layer PCB200/W(1)
SO package, single-layer PCB300/W(1)
Power Supply Voltage RatingVDDRs200, < 5 min-2860V
Operating TemperatureTA-40150
Maximum Junction TemperatureTJ 168 hours-55165
Storage TemperatureTSTG-65175
ESD Protection (HBM)VESD_HBMHuman Body Model (HBM) per AEC-Q100-002-88KVESD-HBM test uses bare die.
Operating VoltageVDDTJ < TJ(Max.)424V(2)
Reverse VoltageVDDRIDD < -10mA, TA=25-28-V
High Undervoltage LockoutUVLOHB > BOP+2.0mT, VDD Rising From 1.5V1.95V
Low Undervoltage LockoutUVLOLB > BOP+2.0mT, VDD Decreasing From 2.5V1.75V
Undervoltage Lockout HysteresisUVLOHYSUVLOH - UVLOL250mV
Low Operating CurrentIDDLVDD=4 to 24 V, TA=254mA
High Operating CurrentIDDHVDD=4 to 24 V, TA=2526mA
Power-Up Output Valid TimetonVDD > 2.5V5060s
Output Delay TimetdB=BRP to BOP1540s
BandwidthfBW--20KHz
Switching Point (BOP)BOPHXS21CSO, TA=-40to 125+6.0+8.0+10.0mT(1)(1)
HXS21CUA, TA=-40to 125-10.0-8.0-6.0mT(1)(1)
Release Point (BRP)BRPHXS21CSO, TA=-40to 125-10.0-8.0(2)-6.0mT(1)(2)
HXS21CUA, TA=-40to 1256.08.010.0mT(1)(1)
Hysteresis (BHYS)BHYSTA=-40to 12512.016.020.0mT
TA=-40to 12512.016.020.0mT
Magnetic Symmetry (BO)BO(BOP+BRP)/2, HXS21CSO-2.00+2.0mT
(BOP+BRP)/2, HXS21CUA-2.00+2.0mT

Notes:
(1) Maximum operating voltage must meet power dissipation and junction temperature requirements, refer to thermal characteristics.
(2) Test value at TA=+25C, VDD = 12V is typical.
(1) 1mT=10Gs
(2) Magnetic flux density B, North pole magnetic field is negative, South pole magnetic field is positive.


2506041705_HUAXIN-S21C_C49023401.pdf

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