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quality Single channel silicon photomultiplier Broadcom AFBR-S4N44P014M with reduced crosstalk and enhanced PDE factory
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quality Single channel silicon photomultiplier Broadcom AFBR-S4N44P014M with reduced crosstalk and enhanced PDE factory
quality Single channel silicon photomultiplier Broadcom AFBR-S4N44P014M with reduced crosstalk and enhanced PDE factory
quality Single channel silicon photomultiplier Broadcom AFBR-S4N44P014M with reduced crosstalk and enhanced PDE factory
>
Specifications
Voltage - DC Reverse(Vr):
32V
Spectral Range:
250nm~900nm
Operating Temperature:
-20℃~+60℃
Mfr. Part #:
AFBR-S4N44P014M
Package:
LGA-5
Key Attributes
Model Number: AFBR-S4N44P014M
Product Description

Product Overview

The Broadcom AFBR-S4N44P014M is a single-channel silicon photomultiplier (SiPM) designed for ultra-sensitive precision measurements of single photons. Leveraging NUV-MT technology, it offers enhanced photo-detection efficiency (PDE), reduced dark count rate, and lower crosstalk compared to previous NUV-HD technology. Its 40 m SPAD pitch allows for tiling multiple units to cover larger areas. Encased in a highly transparent epoxy mold compound, it exhibits broad spectral response with high sensitivity in the blue and near-UV regions. This SiPM is ideally suited for detecting low-level pulsed light sources, including Cherenkov or scintillation light from common organic and inorganic scintillator materials. It is lead-free and RoHS compliant.

Product Attributes

  • Brand: Broadcom
  • Technology: NUV-MT
  • Encapsulation: Epoxy clear mold compound
  • Compliance: Lead-free, RoHS, CFM, REACH

Technical Specifications

Parameter Symbol Min. Typical Max. Unit Reference
Geometric Features
Package outer dimensions PD 4.31 x 4.18 mm
Single device area DA 3.84 x 3.74 mm
Active area AA 3.72 x 3.62 mm
Micro cell pitch LCELL 40 m
Number of micro cells per element NCELLS 8334
Optical and Electrical Features
Spectral range 250 900 nm Figure 5
Peak sensitivity wavelength PK 420 nm Figure 5
Breakdown voltage VBD 32 32.5 33 V Figure 7
Temperature coefficient of breakdown voltage VBD/T 30 mV/C
Photo-detection efficiency (at 420 nm) PDE 63 % Figure 5, Figure 6
Dark current per element (at 12V OV) ID 3.3 A Figure 7
Dark count rate per element (at 0.5 p.e. amplitude) DCR 1.7 Mcps Figure 8
Dark count rate per unit area DCRmm 125 kcps/mm
Gain G 7.3 x106 Figure 9
Optical crosstalk PXTALK 23 % Figure 10
Afterpulsing probability PAD < 1 % Figure 10
Recharge time constant FALL 55 ns Figure 11
Nominal terminal capacitance CT 580 pF
Temperature coefficient of gain G/T 1.46 x104/C
Absolute Maximum Ratings
Storage Temperature TSG 20 +60 C
Operating Temperature TA 20 +60 C a. Biased at constant voltage = 12V above breakdown.
Soldering Temperature TSOLD 245 C b. The tile is reflow solderable according to the solder diagram shown in Figure 4.
Lead Soldering Time tSOLD 60 s b,c
Electrostatic Discharge Voltage Capability (HBM) ESDHBM 2 kV
Electrostatic Discharge Voltage Capability (CDM) ESDCDM 500 V
Operating Overvoltage VOV 16 V

2504101957_Broadcom-AFBR-S4N44P014M_C18212188.pdf

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